IEC Equipment Reliability Testing – Part 4: Statistical Procedures for Exponential Distribution – Point Estimates, Confidence Intervals, Prediction. Buy IEC EQUIPMENT RELIABILITY TESTING – PART 4: STATISTICAL PROCEDURES FOR EXPONENTIAL DISTRIBUTION – POINT ESTIMATES. Buy IEC Ed. Equipment reliability testing Part 4: Statistical procedures for exponential distribution – Point estimates, confidence intervals, prediction.
Statistical methods in maintainability evaluation. Search all products by. Deals with dependability performance issues including availability performance, reliability performance, maintainability performance, and maintenance support performance. This standard has been withdrawn. Please download Chrome or Firefox or view our browser tips. Accept irc continue Learn more about the cookies we use and how to change your settings. Standardization of data-collection practices facilitates the exchange of information between parties, e.
Your Alert Profile lists the documents that will be monitored. Click to learn more. The failure modes defined in ISO Repairable items manufactured in lots. Point estimates, confidence intervals, prediction intervals and tolerance intervals Status: Describes plans and procedures for inspection by attributes. Describes numerical methods for performing a Weibull goodness of fit test for two-parameter Weibull distribution using maximum likelihood methods. Describes techniques covering quantitative aspects of maintainability.
Application guide- Reliability test conditions and statistical test iecc. Describes direct current dc powered mobile equipment tests as give in IEC Describes preferred test conditions as give in IEC Tests which include cycles designed according to this standard are not intended to replace ordinary tests such as qualification tests, functional pe rformance tests and environmental tests.
Describes aspects of verification necessary to ensure that the specified maintainability requirements of an item have been met and provides suitable procedures and test methods. Describes procedures to estimate the parameters of the power law model along with confidence intervals for failure intensity, and prediction intervals for the time to future failures along with a test of goodness of fit to data from repaired items.
Proceed to Checkout Continue Shopping. You may experience issues viewing this site in Internet Explorer 9, 10 or Describes statistical methods for evaluating point estimates, confidence intervals, prediction intervals, and tolerance intervals for the failure rate of items whose time to failure follows and exponential distribution.
Describes and application guide to reliability stress screening for electronic hardware. Describes procedures for modeling system reliability to calculate reliability and availability measures and contains a standard set of symbols related to reliability parameters.
IEC Presentation and specification of reliability data for electronic components. Ministry of Commerce and Industry. Worldwide Standards We can source any standard from anywhere in the world.
Application guide- Section 6: Application guide-Integrated logistic support. Describes data needed to characterizing reliability of components and gives guidance to users how to specify their reliability requirements to manufacturers.
Describes guidance on reliability stress screening techniques and procedures for electronic components. It also identifies typical life cycle cost elements to facilitate project and programme planning.
Learn more about the cookies we use and how to change your settings. Examples, guidelines, and principles for the exchange and merging of such RM data are addressed. This website is best viewed with browser version ifc up to Microsoft Internet Explorer 8 or Firefox 3.
We have no amendments or corrections for this standard. This standard also addresses the collection, analysis and presentation of maintainability related data, which may be required during, and at the completion of, design and during item production and operation.
Equipment for stationary use in weather protected locations — High degree of simulation. Describes implementation of a maintainability program. Part 4- Section 8: This part of IEC provides 6065 general introduction to the concept of life cycle costing and covers all applications.
Please first verify your email before subscribing to alerts.
Equipment reliability testing – Part 2: Application guide- Reliability stress screening of electronic hardware. Guide to the specification of dependability requirements. Also refer to following documents for data collection: Methods of evaluating the performance of intelligent valve positioners with pneumatic outputs which specifies design reviews and tests intended to measure the valve characteristics. Application guide- Jec 2: Design of test cycles.
Outdoor transportable equipment — Low degree of simulation.
BS IEC 60605-4:2001
Statistical procedures for exponential distribution — Point estimates, confidence intervals, prediction intervals and tolerance intervals. The major technical changes with respect to the previous edition concern the inclusion of corrected formulae for tests previously included in a corrigendum, and the addition of new methods for the analysis of multiple items.
Describes life cycle costing concepts and general guidance for conducting life cycle cost analysis.